发明名称 Method of forming cavity between multilayered wirings
摘要 A method that can readily form a cavity structure between metallic wirings in, for example, semiconductors using a polyamic acid and/or a polyimide obtained by reacting a specific alicyclic tetracarboxylic acid dianhydride and a specific alicyclic diamine. The method includes a step of coating the surface of a first dielectric film formed on a semiconductor substrate with a polyamic acid and/or a polyimide, a step of patterning a cavity-forming polymer between the multilayered wirings, a step of forming a second dielectric film on the cavity-forming polymer between the multilayered wirings containing a metallic wiring, and a step of removing the cavity-forming polymer between the multilayered wirings by heating to form a cavity between the metallic wirings.
申请公布号 US2004092127(A1) 申请公布日期 2004.05.13
申请号 US20030693972 申请日期 2003.10.28
申请人 JSR CORPORATION 发明人 KUROSAWA TAKAHIKO;SHIRATO KAORI
分类号 C08G73/10;H01L21/764;H01L21/768;H01L23/482;H01L23/522;H01L23/532;(IPC1-7):H01L21/302;H01L21/461 主分类号 C08G73/10
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