发明名称 Dedicated redundancy circuits for different operations in a flash memory device and methods of operating the same
摘要 A flash memory device can include a first redundancy circuit configured to provide read repair information for read operations to the flash memory. The flash memory device can also include a second redundancy circuit, separate from the first redundancy circuit, configured to provide write repair information for write operations to the flash memory. The flash memory device can include a dedicated-read operation redundancy circuit configured to provide read repair information and a dedicated-write operation redundancy circuit configured to provide write repair information. The flash memory device can include also include a first redundancy circuit configured to store an address of a defective memory cell in the flash memory and a second redundancy circuit, separate from the first redundancy circuit, configured to store the address of the defective memory cell.
申请公布号 US2004090831(A1) 申请公布日期 2004.05.13
申请号 US20030630116 申请日期 2003.07.30
申请人 IM JAE-WOO;LIM YOUNG-HO 发明人 IM JAE-WOO;LIM YOUNG-HO
分类号 G11C16/06;G11C7/00;G11C11/34;G11C29/00;G11C29/04;(IPC1-7):G11C7/00 主分类号 G11C16/06
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