发明名称 |
Shearing interferometry system for measurement of a wave front for use in measuring an optical imaging system in order to quantify its quality, said system having filters to suppress unwanted higher diffraction orders |
摘要 |
<p>Device for measuring an optical imaging system by wave front measurement using shearing interferometry comprises: an illumination component on the object side prior to the imaging system (1); a diffraction grating (3) arranged in front of the image plane; a filter mask (4) in the image plane and a detector unit (5) arranged after the detector. The illumination component has a coherence mask (2) with a multiple opening mask structure that is used to suppress undesirable diffraction orders. Alternately or additionally the filter mask in the image plane can be moved.</p> |
申请公布号 |
DE10260985(A1) |
申请公布日期 |
2004.05.13 |
申请号 |
DE2002160985 |
申请日期 |
2002.12.18 |
申请人 |
CARL ZEISS SMT AG |
发明人 |
HAIDNER, HELMUT;HOCH, RAINER;DOERING, GORDON |
分类号 |
G01J9/02;G01M11/02;G02B27/44;G03F7/20;(IPC1-7):G01J9/04;G02B27/42;G01B9/02 |
主分类号 |
G01J9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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