发明名称 |
METHOD FOR FABRICATING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for fabricating a capacitor of a semiconductor device is provided to easily form a capacitor and improve an electrical characteristic of the capacitor by increasing adhesion between an oxide layer of the capacitor and a Ru layer and by improving the quality of the Ru layer. CONSTITUTION: The oxide layer(11) of the capacitor is formed on the semiconductor substrate(10) on which a predetermined process is performed. An adhesion layer is formed on the oxide layer of the capacitor. The first metal layer for a lower electrode is formed on the adhesion layer. A dielectric layer with a high dielectric constant is formed on the first metal layer. A heat treatment is performed on the dielectric layer. The second metal layer(15) for an upper electrode is formed on the dielectric layer. The adhesion layer is made of a TaN layer(12). The first metal layer is made of a Ru layer(13) by an ALD(atomic layer deposition) method.
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申请公布号 |
KR20040039982(A) |
申请公布日期 |
2004.05.12 |
申请号 |
KR20020068245 |
申请日期 |
2002.11.05 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, GYEONG MIN;LEE, JONG MIN |
分类号 |
H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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