METHOD FOR FABRICATING SEMICONDUCTOR MEMORY DEVICE
摘要
PURPOSE: A method for fabricating a semiconductor memory device is provided to make the surface of a capacitor electrode uniform and guarantee a uniform thickness of a dielectric layer by controlling a grain growth and an agglomeration phenomenon on the surface of the electrode. CONSTITUTION: A semiconductor substrate(100) is prepared. A lower electrode(110) is formed on the semiconductor substrate. A dielectric layer is formed on the lower electrode. An upper electrode(130) is formed on the dielectric layer. Hetero-metal atoms having a different property than that of a main metal are melted into a main metal layer.
申请公布号
KR20040039616(A)
申请公布日期
2004.05.12
申请号
KR20020067744
申请日期
2002.11.04
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
KIM, SEONG TAE;KIM, WAN DON;LEE, GWANG HUI;LIM, HAN JIN;OH, SE HUN;YOO, CHA YEONG