发明名称 METHOD FOR FABRICATING SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE: A method for fabricating a semiconductor memory device is provided to make the surface of a capacitor electrode uniform and guarantee a uniform thickness of a dielectric layer by controlling a grain growth and an agglomeration phenomenon on the surface of the electrode. CONSTITUTION: A semiconductor substrate(100) is prepared. A lower electrode(110) is formed on the semiconductor substrate. A dielectric layer is formed on the lower electrode. An upper electrode(130) is formed on the dielectric layer. Hetero-metal atoms having a different property than that of a main metal are melted into a main metal layer.
申请公布号 KR20040039616(A) 申请公布日期 2004.05.12
申请号 KR20020067744 申请日期 2002.11.04
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, SEONG TAE;KIM, WAN DON;LEE, GWANG HUI;LIM, HAN JIN;OH, SE HUN;YOO, CHA YEONG
分类号 H01L27/108;H01L21/02;(IPC1-7):H01L27/108 主分类号 H01L27/108
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