发明名称 Lead penetrating clamping system
摘要 An apparatus and method of forming improved wire bonds between the contact pads on semiconductor devices and individual lead frame fingers of a lead frame. The apparatus and method include the use of a penetrating individual independent lead finger clamp during the wire bonding process to provide increased stability of the individual lead finger for improved bonding by the clamp penetrating a portion of the lead finger being bonded. If desired, the apparatus and method also provide for the use of either a penetrating or nonpenetrating fixed clamp for the lead fingers during the wire bonding process in addition to the penetrating individual independent lead finger clamp during the wire bonding process to provide increased stability of the individual lead finger for improved bonding.
申请公布号 US6732902(B2) 申请公布日期 2004.05.11
申请号 US20020213019 申请日期 2002.08.05
申请人 MICRON TECHNOLOGY, INC. 发明人 BALL MICHAEL B.
分类号 B23K20/00;H01L21/48;H01L21/603;(IPC1-7):B23K37/04;B23K31/02 主分类号 B23K20/00
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