发明名称 Vertical transistor DRAM structure and its manufacturing methods
摘要 A vertical transistor DRAM structure is disclosed by the present invention, in which a trench structure comprises a deep-trench region having a vertical transistor and a second-type shallow-trench-isolation region being formed in a side portion of the deep-trench region and a common-drain structure comprises different implant regions being formed under a common-drain diffusion region in another side portion of the deep-trench region. The vertical transistor DRAM structure is, used to implement two contactless DRAM arrays. A first-type contactless DRAM array comprises a plurality of metal bit-lines integrated. with planarized common-drain conductive islands and a plurality of highly conductive word-lines. A second-type contactless DRAM array comprises a plurality of metal word-lines integrated with planarized common-gate conductive islands and a plurality of common-drain conductive bit-lines.
申请公布号 US6734484(B2) 申请公布日期 2004.05.11
申请号 US20020227438 申请日期 2002.08.26
申请人 INTELLIGNET SOURCES DEVELOPMENT CORP. 发明人 WU CHING-YUAN
分类号 H01L21/8242;H01L27/108;H01L29/94;(IPC1-7):H01L31/116 主分类号 H01L21/8242
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