发明名称 Semiconductor memory device having a plug contacted to a capacitor electrode and method for fabricating the capacitor
摘要 The present invention provides a semiconductor memory device and a fabrication method capable of preventing the contact between a dielectric layer of a capacitor and a diffusion barrier. The plug comprises a diffusion barrier layer and a seed layer for forming a lower electrode of a capacitor. Accordingly, it is possible to prevent the dielectric layer being contacted with the diffusion barrier, whereby the leakage current may be reduced, and the capacitance of the capacitor may be increased.
申请公布号 US6734061(B2) 申请公布日期 2004.05.11
申请号 US20010888060 申请日期 2001.06.25
申请人 HYNIX SEMICONDUCTOR INC. 发明人 HONG KWON;CHOI HYUNG-BOK
分类号 H01L27/108;H01L21/02;H01L21/8242;H01L27/105;(IPC1-7):H01L21/824;H01L29/76 主分类号 H01L27/108
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