发明名称 SEMICONDUCTOR STRUCTURE OF MEMORY DEVICE, COMPOSED OF SUBSTRATE OF FIRST CONDUCTIVITY TYPE, FIRST DOPANT REGION OF SECOND CONDUCTIVITY TYPE, SECOND DOPANT REGION, GATE DIELECTRIC, FIRST GATE CONDUCTOR, AND FIELD-EFFECT TRANSISTOR, AND PROGRAMMING METHOD FOR NON-VOLATILE MEMORY DEVICE
摘要 PURPOSE: A semiconductor structure of a memory device and a programming method for a non-volatile memory device are provided to improve high voltage endurance of a drain or a source of a transistor. CONSTITUTION: A semiconductor structure includes a substrate(102) of a first conductivity type, a first dopant region of a second conductivity type included in the substrate, a second dopant region, a gate dielectric(110B) formed on the second dopant region, a first gate conductor(112B) formed on the gate dielectric, and a field-effect transistor having a second gate conductor coupled to the first gate conductor. The second dopant region of the first conductivity type is formed in the first dopant region and is more heavily doped than the first dopant region. The second dopant region, the gate dielectric, and the gate conductor form one capacitor.
申请公布号 KR20040038864(A) 申请公布日期 2004.05.08
申请号 KR20030076625 申请日期 2003.10.31
申请人 MICREL INC. 发明人 MOORE PAUL M.
分类号 G11C16/04;H01L21/28;H01L21/336;H01L21/8247;H01L27/115;(IPC1-7):H01L27/115 主分类号 G11C16/04
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