发明名称 ALL-OPTICAL MEMORY DEVICE USING EMILD STRUCTURE
摘要 PURPOSE: An all-optical memory device using an EMILD(Electro-absorption Modulator Integrated Laser Diode) structure is provided to measure optical bistability features by using an EMILD structure, and to realize an all-optical flip-flop function by using the measured features, thereby reducing cost. CONSTITUTION: A variable laser(100) selects a wavelength of an input light. A pattern generator(110) forms the input light as 'set' and 'reset' pattern optical signals. An optical attenuator(120) controls strength of the pattern optical signals. A circulator(130) determines a path of the pattern optical signals. A phase controller(140) is applied with the pattern optical signals, and controls phases. An EMILD(150) is applied with the pattern optical signals, and obtains optical bistability features. A wavelength variable filter(160) filters an output light signal, and obtains a selected wavelength signal only. An optical measurer(170) obtains all-optical flip-flop wavelength features by using the optical bistability features.
申请公布号 KR20040037732(A) 申请公布日期 2004.05.07
申请号 KR20020066339 申请日期 2002.10.30
申请人 KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 KIM, JAE HEON;KIM, SEON HO;KIM, YEONG IL;LEE, SEOK;WOO, DEOK HA;YOON, TAE HUN
分类号 G02F3/00 主分类号 G02F3/00
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