发明名称 |
ALL-OPTICAL MEMORY DEVICE USING EMILD STRUCTURE |
摘要 |
PURPOSE: An all-optical memory device using an EMILD(Electro-absorption Modulator Integrated Laser Diode) structure is provided to measure optical bistability features by using an EMILD structure, and to realize an all-optical flip-flop function by using the measured features, thereby reducing cost. CONSTITUTION: A variable laser(100) selects a wavelength of an input light. A pattern generator(110) forms the input light as 'set' and 'reset' pattern optical signals. An optical attenuator(120) controls strength of the pattern optical signals. A circulator(130) determines a path of the pattern optical signals. A phase controller(140) is applied with the pattern optical signals, and controls phases. An EMILD(150) is applied with the pattern optical signals, and obtains optical bistability features. A wavelength variable filter(160) filters an output light signal, and obtains a selected wavelength signal only. An optical measurer(170) obtains all-optical flip-flop wavelength features by using the optical bistability features. |
申请公布号 |
KR20040037732(A) |
申请公布日期 |
2004.05.07 |
申请号 |
KR20020066339 |
申请日期 |
2002.10.30 |
申请人 |
KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
KIM, JAE HEON;KIM, SEON HO;KIM, YEONG IL;LEE, SEOK;WOO, DEOK HA;YOON, TAE HUN |
分类号 |
G02F3/00 |
主分类号 |
G02F3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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