PROBE CARD TIP OF PROBE DEVICE IN WHICH INTEGRATION CIRCUIT TEST TIME IS IMPROVED AND METHOD FOR TESTING THE SAME

摘要

PURPOSE: A probe card tip of a probe device in which an integration circuit test time is improved and a method for testing the same are provided to reduce the test time by the amount of time of simultaneously testing the main chip and the sub-chip, which is accumulated at each step. CONSTITUTION: A probe card tip of a probe device improving an integration circuit test time includes a main tip(110) and a probe card tip(120). The main tip(110) inputs and outputs the test signal to the main chip(MC) to test a predetermined common item and a predetermined intrinsic item. And, the probe card tip(120) inputs and outputs the test signal to the sub-chip(SC) to test the predetermined common items.