发明名称 CARRIER HEAD OF CHEMICAL MECHANICAL POLISHING APPARATUS
摘要 PURPOSE: A carrier head of a CMP(Chemical Mechanical Polishing) apparatus is provided to vary the pressure applied to the backside of a wafer according to a variety of needs under a polishing process and obtaining various profiles for wafers. CONSTITUTION: A carrier head of a CMP apparatus is provided with a carrier housing(10) for being driven by a carrier driving shaft, a holder housing(15) fixedly installed at the lower center portion of the carrier housing, and a membrane holder part(20) installed at the lower portion of the carrier housing for loading a ring type membrane(M) at its lower portion. At this time, the membrane holder part is capable of being moved up and down along the inner wall of the holder housing. The membrane defines a ring type chamber(62) capable of controlling inner pressure. At least one compensation chamber(63) is formed at the lower portion of the membrane holder for controlling the inner pressure. The compensation chamber is capable of dividing the ring type chamber into two chambers(62a,62b) when increasing its inner pressure.
申请公布号 KR20040037764(A) 申请公布日期 2004.05.07
申请号 KR20020066391 申请日期 2002.10.30
申请人 SEMICONTECH CORP. 发明人 AHN, YEONG DEOK;KIM, SEON U;YOO, HAN WON
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
代理机构 代理人
主权项
地址