发明名称 MULTIPLE GATE TRANSISTOR EMPLOYING MONOCRYSTALLINE SILICON WALLS
摘要 A semiconductor fabrication process and structure in which a dielectric structure (106) is formed upon a substrate (102). Silicon is then deposited and processed to form a crystalline silicon wall (118) that envelopes the dielectric structure (106) and is physically and electrically isolated from the substrate (102). A gate dielectric film (130) is formed over at least two surfaces of the silicon wall (118) and a gate electrode film (132) is formed over the gate dielectric (130). The gate electrode film (132) is then patterned followed by conventional source/drain implant processing. Portions of the silicon wall (118) disposed on either side of the gate electrode (140) may then be contacted to form source/drain structures (150). In this manner, the portion of the silicon wall (118) covered by the gate electrode (140) comprises a transistor channel region having multiple surfaces controlled by gate electrode (140).
申请公布号 US2004084674(A1) 申请公布日期 2004.05.06
申请号 US20020285059 申请日期 2002.10.31
申请人 MATHEW LEO;NGUYEN BICH-YEN;PHAM DANIEL THANH-KHAC;VANDOOREN ANNE 发明人 MATHEW LEO;NGUYEN BICH-YEN;PHAM DANIEL THANH-KHAC;VANDOOREN ANNE
分类号 H01L21/336;H01L29/423;H01L29/786;(IPC1-7):H01L29/76 主分类号 H01L21/336
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