发明名称 Semiconductor device having ferroelectric capacitor and hydrogen barrier film and manufacturing method thereof
摘要 A semiconductor device having a semiconductor substrate; an insulating film formed on said semiconductor substrate; a ferroelectric capacitor having a lower electrode, a ferroelectric film and an upper electrode which are stacked sequentially on the insulating film; a first hydrogen barrier film; a first inter-layer insulating film covering said ferroelectric capacitor; and a second inter-layer insulating film stacked on the first inter-layer insulating film, the first hydrogen barrier film being interposed between the first and second interlayer insulating films is proposed.
申请公布号 US2004084701(A1) 申请公布日期 2004.05.06
申请号 US20030602764 申请日期 2003.06.25
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 KANAYA HIROYUKI;MORIMOTO TOYOTA;HIDAKA OSAMU;KUMURA YOSHINORI;KUNISHIMA IWAO;IWAMOTO TSUYOSHI
分类号 H01L21/02;H01L21/8246;H01L27/115;(IPC1-7):H01L29/76;H01L29/94;H01L31/062;H01L31/113;H01L31/119 主分类号 H01L21/02
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