发明名称 Semiconductor device including metal insulator semiconductor field effect transistor and method of manufacturing the same
摘要 A semiconductor device comprises a semiconductor substrate, an N-channel MISFET and a P-channel MISFET provided on the semiconductor substrate, each of the N- and P-channel MISFETs being isolated by an isolation region and having a gate insulating film, a first gate electrode film provided on the gate insulating film of the N-channel MISFET and composed of a first metal silicide, a second gate electrode film provided on the gate insulating film of the P-channel MISFET and composed of a second metal silicide made of a second metal material different from a first metal material composing the first metal silicide, and a work function of the first gate electrode film being lower than that of the second gate electrode film.
申请公布号 US2004084734(A1) 申请公布日期 2004.05.06
申请号 US20030658371 申请日期 2003.09.10
申请人 TOKYO SHIBAURA ELECTRIC CO 发明人 MATSUO KOUJI
分类号 H01L21/28;H01L21/336;H01L21/8238;H01L27/092;H01L29/423;H01L29/49;H01L29/78;H01L29/786;(IPC1-7):H01L29/76;H01L29/94 主分类号 H01L21/28
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