Testing continuity in integrated circuits,申请号GB20020025174-传众专利搜索

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发明名称	Testing continuity in integrated circuits
摘要
申请公布号	GB2394780(A)	申请公布日期	2004.05.05
申请号	GB20020025174	申请日期	2002.10.29
申请人	* IFR LIMITED	发明人	RICHARD JOHN * PAYMAN
分类号	G01R27/20;G01R31/04;(IPC1-7):G01R31/04;G01R31/316	主分类号	G01R27/20
代理机构		代理人
主权项
地址

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