发明名称 COMPOSITION FOR FORMING ANTIREFLECTION FILM FOR LITHOGRAPHY
摘要 <p>There is provided a composition for forming anti-reflective coating for anti-reflective coating that has a good absorption of light at a wavelength utilized for manufacturing a semiconductor device, that exerts a high protection effect against light reflection, that has a high dry etching rate compared with the photoresist layer. Concretely, the composition for forming anti-reflective coating contains a triazine trione compound, oligomer compound or polymer compound having hydroxyalkyl structure as substituent on nitrogen atom.</p>
申请公布号 AU2003271123(A1) 申请公布日期 2004.05.04
申请号 AU20030271123 申请日期 2003.10.08
申请人 NISSAN CHEMICAL INDUSTRIES, LTD. 发明人 TAKAHIRO KISHIOKA;KEN-ICHI MIZUSAWA;TOMOYUKI ENOMOTO;RIKIMARU SAKAMOTO;KEISUKE NAKAYAMA;YASUO KAWAMURA
分类号 G03F7/038;G03F7/09;H01L21/027;(IPC1-7):G03F7/11 主分类号 G03F7/038
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