发明名称 |
Refresh apparatus for semiconductor memory device, and refresh method thereof |
摘要 |
A refresh apparatus for a semiconductor memory device and a refresh method thereof that can reduce a test time by simultaneously refreshing a normal cell and a redundant cell in one test mode is disclosed. The refresh apparatus for the semiconductor memory device may include a redundant cell refresh signal generator for generating a redundant cell refresh signal for refreshing a redundant cell when a refresh is requested in a test mode, a wordline enable signal generator for generating a normal main wordline enable signal and a redundant main wordline enable signal in response to the redundant cell refresh signal in a redundant cell test mode and a wordline driver for simultaneously refreshing the normal and redundant cells by simultaneously driving a normal main wordline and a redundant main wordline in response to the redundant cell refresh signal, the normal main wordline enable signal, the redundant main wordline enable signal and a row address in the redundant cell test mode.
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申请公布号 |
US6731560(B2) |
申请公布日期 |
2004.05.04 |
申请号 |
US20020313445 |
申请日期 |
2002.12.06 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
YOON SEOK CHEOL;LEE JAE JIN;KANG SANG HEE;KIM CHUL HO |
分类号 |
G11C29/56;G11C11/401;G11C11/406;G11C11/408;G11C29/00;G11C29/24;(IPC1-7):G11C7/00 |
主分类号 |
G11C29/56 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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