发明名称 |
Titanium barrier for nickel silicidation of a gate electrode |
摘要 |
Nickel silicidation of a gate electrode is controlled using a titanium barrier layer. Embodiments include forming a gate electrode structure comprising a lower polycrystalline silicon layer, a layer of titanium thereon and an upper polycrystalline silicon layer on the titanium layer, depositing a layer of nickel and silicidizing, whereby the upper polycrystalline silicon layer is converted to nickel silicide and a titanium silicide barrier layer is formed preventing nickel from reacting with the lower polycrystalline silicon layer.
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申请公布号 |
US6730587(B1) |
申请公布日期 |
2004.05.04 |
申请号 |
US20000731006 |
申请日期 |
2000.12.07 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
BERTRAND JACQUES J.;WOO CHRISTY MEI-CHU;NGO MINH VAN;KLUTH GEORGE |
分类号 |
H01L21/28;H01L21/336;H01L29/49;(IPC1-7):H01L21/320 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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