发明名称 Titanium barrier for nickel silicidation of a gate electrode
摘要 Nickel silicidation of a gate electrode is controlled using a titanium barrier layer. Embodiments include forming a gate electrode structure comprising a lower polycrystalline silicon layer, a layer of titanium thereon and an upper polycrystalline silicon layer on the titanium layer, depositing a layer of nickel and silicidizing, whereby the upper polycrystalline silicon layer is converted to nickel silicide and a titanium silicide barrier layer is formed preventing nickel from reacting with the lower polycrystalline silicon layer.
申请公布号 US6730587(B1) 申请公布日期 2004.05.04
申请号 US20000731006 申请日期 2000.12.07
申请人 ADVANCED MICRO DEVICES, INC. 发明人 BERTRAND JACQUES J.;WOO CHRISTY MEI-CHU;NGO MINH VAN;KLUTH GEORGE
分类号 H01L21/28;H01L21/336;H01L29/49;(IPC1-7):H01L21/320 主分类号 H01L21/28
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