发明名称 IN-CIRCUIT TESTER
摘要 PROBLEM TO BE SOLVED: To provide an in-circuit tester having a contact resistance measuring function which measures its contact resistance with respect to a measuring object, and measures an electrical property of the measuring object as it is, when the contact resistance with respect to the measuring object is judged normal by that measurement. SOLUTION: The in-circuit tester 11 is equipped with a first measurement circuit 17 for measuring the measuring object, a second measurement circuit 25 for measuring the contact resistance of a power supply pin 13, a controller unit 24, and a relay circuit 23 for performing a changeover of the individual circuits. First of all, the in-circuit tester 11 measures the contact resistance of the power pin 13 by the second circuit 25. When the controller unit 24 judges that the contact resistance of the power pin 13 is unusual, the electrical property of the measuring object is not measured. When the controller unit 24 judges that the contact resistance of the power pin 13 is normal, the second circuit 25 is changed over to the first circuit 17. Accordingly, the electrical property of the measuring object can be measured by the in-circuit tester 11. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004132727(A) 申请公布日期 2004.04.30
申请号 JP20020295010 申请日期 2002.10.08
申请人 TOKAI RIKA CO LTD 发明人 OKADA YUKIYASU;SHIMIZU ISAO;MORI HISAHIRO;NODA TAKAHISA;KANO YUKIO
分类号 G01R1/06;G01R27/02;G01R31/02;G01R31/28;(IPC1-7):G01R27/02 主分类号 G01R1/06
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