发明名称 |
COOLING SYSTEM OF WAFER PHOTO ETCHING APPARATUS |
摘要 |
PURPOSE: A cooling system of a wafer photo etching apparatus is provided to perform a temperature control operation regardless of a defect of a temperature controller of one unit and enhance the productivity by installing the temperature controller at each unit of the wafer photo etching apparatus. CONSTITUTION: A cooling system of a wafer photo etching apparatus includes a plurality of temperature controller for controlling totally the temperature of each unit of the wafer photo etching apparatus. The temperature controllers are installed at each unit of the wafer photo etching apparatus in order to control independently the temperature of each unit of the wafer photo etching apparatus. Two temperature controllers are installed at each unit of the wafer photo etching apparatus.
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申请公布号 |
KR20040036299(A) |
申请公布日期 |
2004.04.30 |
申请号 |
KR20020065264 |
申请日期 |
2002.10.24 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HUH, GWANG YEONG |
分类号 |
H01L21/306;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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