发明名称 |
SUBSTRATE TREATMENT METHOD, HEATING TREATMENT APPARATUS, AND PATTERN FORMING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To suppress an acid from sticking again onto a resist film in PEB (post exposure bake) treatment. SOLUTION: The substrate treatment method includes a step for forming a chemically amplified resist film on a substrate, a step for irradiating the chemically amplified resist film with energy rays to form a latent image, and a step for applying heating treatment to the chemically amplified resist film. The heating treatment is performed while relatively moving a heating part for heating the chemically amplified resist film and the substrate, by forming an air current which flows backwards in the relative moving direction of the heating part between a lower surface of the heating part and the chemically amplified resist film. COPYRIGHT: (C)2004,JPO |
申请公布号 |
JP2004134674(A) |
申请公布日期 |
2004.04.30 |
申请号 |
JP20020299576 |
申请日期 |
2002.10.11 |
申请人 |
TOSHIBA CORP |
发明人 |
KAWANO KENJI;ITO SHINICHI;SHIOBARA HIDESHI |
分类号 |
G03F7/38;G03F7/004;G03F7/40;H01L21/00;H01L21/027;H01L21/469;(IPC1-7):H01L21/027 |
主分类号 |
G03F7/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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