发明名称 CMOS IMAGE SENSOR AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A CMOS(Complementary Metal Oxide Semiconductor) image sensor and a manufacturing method thereof are provided to be capable of minimizing the voltage drop due to the threshold voltage of a native NMOSFET and restraining the deterioration of the threshold voltage. CONSTITUTION: A CMOS image sensor is provided with a photo diode(27,33) for generating and storing photo-generated charges, a floating diffusion region for storing the photo-generated charges transmitted from the photo diode and being sensed, and a transfer transistor connected with the photo diode through its one side and the floating diffusion region through its the other side. The CMOS image sensor further includes a reset transistor connected with the floating diffusion region through its one side and a voltage supply terminal through its other side. At this time, the transfer transistor and the reset transistor are native MOS transistors. At the time, the transfer transistor and the reset transistor have an LDD(Lightly Doped Drain) region at their predetermined portion, respectively.
申请公布号 KR20040036086(A) 申请公布日期 2004.04.30
申请号 KR20020064888 申请日期 2002.10.23
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KWON, GYEONG GUK;LEE, WON HO
分类号 H01L27/146;(IPC1-7):H01L27/146 主分类号 H01L27/146
代理机构 代理人
主权项
地址