发明名称 METHOD FOR MANUFACTURING IMAGE SENSOR USING SALICIDE PROCESS
摘要 PURPOSE: A method for manufacturing an image sensor using a salicide process is provided to be capable of preventing a salicide layer from being formed at a photo diode region and simultaneously forming the salicide layer on a gate electrode of a transistor. CONSTITUTION: A gate electrode(25) is formed on a selected region of a semiconductor layer. An insulating spacer is formed at both sidewalls of the gate electrode. A photo diode is formed at one side of the gate electrode in the semiconductor layer. A floating diffusion region(29) is formed at the other side of the gate electrode in the semiconductor layer. A salicide barrier(30b) is formed on the resultant structure. At this time, the gate electrode and the floating diffusion region are opened to the outside. A plurality of salicide layers(35a,35b) are formed on the gate electrode and the floating diffusion region, respectively.
申请公布号 KR20040036048(A) 申请公布日期 2004.04.30
申请号 KR20020064833 申请日期 2002.10.23
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LIM, BU TAEK
分类号 H01L27/146;H01L21/00;H01L21/3205;H01L21/336;H01L21/4763;H01L21/8238;H01L31/10;H04N5/335;H04N5/369;H04N5/374;(IPC1-7):H01L27/146 主分类号 H01L27/146
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