发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device in which enhancements of characteristics and isolation particularly as a basic element of an FET can be obtained simultaneously. SOLUTION: The spreading of a depletion layer is suppressed by forming a heavily doped impurity region between a gate electrode and an electrode pad of an FET, a second FET having contiguous wiring, a gate metal layer, and an impurity layer. The alignment accuracy of a mask is enhanced by using an oxide film formed on a source-drain region for aligning the mask of the FET. The basic performance of the FET is enhanced even if the gate width is shrunk, and since a clearance between the FETs can be reduced by shrinking the gate width with characteristics equivalent to conventional characteristics, a 5 GHz switch having enhanced isolation can be obtained. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004134589(A) 申请公布日期 2004.04.30
申请号 JP20020297748 申请日期 2002.10.10
申请人 SANYO ELECTRIC CO LTD 发明人 ASANO TETSUO;SAKAKIBARA MIKITO;NAKAJIMA YOSHIFUMI;ISHIHARA HIDETOSHI
分类号 H01L21/822;H01L21/338;H01L21/761;H01L21/762;H01L21/8234;H01L27/04;H01L27/06;H01L27/095;H01L29/423;H01L29/812;(IPC1-7):H01L27/095 主分类号 H01L21/822
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