发明名称 SEMICONDUCTOR DEVICE AND ITS TESTING METHOD
摘要 PROBLEM TO BE SOLVED: To enable a debug operation having a high degree of freedom without influencing an original circuit. SOLUTION: An instruction decoder 12 decodes an instruction code of an instruction register 11 in a predetermined timing, and sends it to a capture controller 14. A trigger detector 13 monitors the change in state of a trigger signal line 31, and notifies the change to the capture controller 14. When the state change of the trigger signal line 31 is notified according to the decoded instruction, and the trigger matches the trigger condition, the capture controller 14 determines that the trigger condition is established. At this time, a capturer 15 starts after a delayed time passes when the delayed time is set or immediately when the delayed time is not set. The capturer 15 starts capturing according to the capture controller 14, reads the state of an observation signal line 32, and outputs it as an observation result. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004132844(A) 申请公布日期 2004.04.30
申请号 JP20020297858 申请日期 2002.10.10
申请人 SONY CORP 发明人 NAKAMURA MASAYUKI
分类号 G01R31/28;H01L21/822;H01L27/04;(IPC1-7):G01R31/28 主分类号 G01R31/28
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