SEMICONDUCTOR INTEGRATED CIRCUIT AND ITS INSPECTION METHOD

摘要

PROBLEM TO BE SOLVED: To shorten an inspection time of an A/D converter by dispensing with an operation for changing finely a voltage to be applied to an analog signal input terminal from a low-side reference voltage to a high-side reference voltage in a semiconductor integrated circuit including a flash-type A/D converter. SOLUTION: This semiconductor integrated circuit including the flash-type A/D converter having a comparator group 105 for comparing an analog input signal with the reference voltage and a sample & hold circuit 108 for holding the output of the comparator group is equipped with a means 106 capable of observing each output of the comparator group 105. COPYRIGHT: (C)2004,JPO