发明名称 MANUFACTURING AND HEAT-TREATING METHODS OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To apply a technique for forming a fine, high-performance insulating film by eliminating the influence of contraction on a substrate by heat treatment in a manufacturing process in a thin film element, such as a TFT formed on a glass substrate, and to provide a semiconductor device for achieving high performance and superior reliability by using the technique. SOLUTION: In a process for forming the thin-film element composed using the glass substrate for laminating a plurality of thin films, a film for absorbing radiation from a heat source is locally formed at the specific portion of the substrate, on which the thin film element is formed for heat-treating to prevent the substrate from being damaged thermally. In the substrate to be applied, a material that has the low absorption factor of the radiation from the heat source and cannot be heated easily is applied; and the film for absorbing the radiation from the heat source is provided locally on the main surface of the substrate for heat-treatment. Then, a targeted structure is heated by conduction heating from the film for heat-treatment. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004134760(A) 申请公布日期 2004.04.30
申请号 JP20030305618 申请日期 2003.08.29
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 TAKAYAMA TORU;YAMAGUCHI TETSUJI;YAMAZAKI SHUNPEI
分类号 H01L21/20;H01L21/26;H01L21/322;H01L21/336;H01L29/786;(IPC1-7):H01L21/336 主分类号 H01L21/20
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