发明名称 Method for producing an integrated semiconductor memory configuration
摘要 A method for producing an integrated semiconductor memory configuration includes forming two capacitor modules for each selection transistor from the front and rear side of the substrate wafer respectively. Thus, a higher packing density of memory cells is engendered by the utilization of the rear side of the wafer. A twofold memory read signal can be used for the same cell surface area. Conditions in addition to "0" or "1" can also be saved for each selection transistor in a ferroelectric memory configuration, if the two capacitor modules have a different structure in terms of layer thickness, surface area, or material.
申请公布号 US2004082117(A1) 申请公布日期 2004.04.29
申请号 US20030609805 申请日期 2003.06.30
申请人 KASTNER MARCUS;MIKOLAJICK THOMAS 发明人 KASTNER MARCUS;MIKOLAJICK THOMAS
分类号 H01L21/8242;H01L21/8246;H01L27/06;H01L27/105;H01L27/108;H01L27/115;(IPC1-7):H01L21/00 主分类号 H01L21/8242
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