发明名称 PUMPING/PURGING METHOD OF LOAD LOCK CHAMBER FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A pumping/purging method of a load lock chamber for fabricating a semiconductor device is provided to prevent particles and contamination within the load lock chamber by controlling a supply process of vacuum pressure and a supply process of purge gas. CONSTITUTION: A semiconductor fabrication system includes a load lock chamber for forming airtight atmosphere, a vacuum pump for providing vacuum pressure, a gas supply unit for providing purge gas, a control valve for controlling the supply of the vacuum pressure and the supply of the purge gas, and a control unit for controlling operations of the vacuum pump, the gas supply unit, and the control valve. The vacuum pressure and the purge gas are provided at a time point to change the internal pressure of the load lock chamber(ST200-ST214). One process of the vacuum pressure supply process and the purge gas supply process is interrupted step by step(ST216-ST224).
申请公布号 KR20040035342(A) 申请公布日期 2004.04.29
申请号 KR20020064455 申请日期 2002.10.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, BONG JIN
分类号 C23C16/44;H01L21/00;H01L21/02;(IPC1-7):H01L21/00 主分类号 C23C16/44
代理机构 代理人
主权项
地址