发明名称 |
Process control using on-line instrumentation and process models |
摘要 |
A method for providing improved estimates of properties of a chemical manufacturing process is disclosed. The method employs a process model that includes, or is modified by, scores or other gains obtained from the mathematical transformation of data obtained from an on-line analyzer. Chemical manufacturing processes using the method also are disclosed.
|
申请公布号 |
US2004083028(A1) |
申请公布日期 |
2004.04.29 |
申请号 |
US20020281624 |
申请日期 |
2002.10.28 |
申请人 |
VAIDYANATHAN RAMASWAMY;HURLBUT RONALD S.;STEPHENS WILLIAM D.;VAN HARE DAVID R. |
发明人 |
VAIDYANATHAN RAMASWAMY;HURLBUT RONALD S.;STEPHENS WILLIAM D.;VAN HARE DAVID R. |
分类号 |
B01J8/10;B01J8/36;B01J19/00;(IPC1-7):G05B21/00 |
主分类号 |
B01J8/10 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|