发明名称 Process control using on-line instrumentation and process models
摘要 A method for providing improved estimates of properties of a chemical manufacturing process is disclosed. The method employs a process model that includes, or is modified by, scores or other gains obtained from the mathematical transformation of data obtained from an on-line analyzer. Chemical manufacturing processes using the method also are disclosed.
申请公布号 US2004083028(A1) 申请公布日期 2004.04.29
申请号 US20020281624 申请日期 2002.10.28
申请人 VAIDYANATHAN RAMASWAMY;HURLBUT RONALD S.;STEPHENS WILLIAM D.;VAN HARE DAVID R. 发明人 VAIDYANATHAN RAMASWAMY;HURLBUT RONALD S.;STEPHENS WILLIAM D.;VAN HARE DAVID R.
分类号 B01J8/10;B01J8/36;B01J19/00;(IPC1-7):G05B21/00 主分类号 B01J8/10
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