发明名称 Circuit and method for calibrating dram pullup Ron to pulldown Ron
摘要 Embodiments of the present invention enable the matching of pull-up and pull-down driver strengths of a slave device (DDRII SDRAM), i.e., the P-channel/N-channel driver pull-up/pull-down Ron and also calibrates the P-channel/N-channel pull-up/pull-down drivers in their linear region of operation. Specifically, embodiments of the present invention may use the DDR-II Off Chip Driver (OCD) protocol for calibration, in addition to using circuit techniques to calibrate the slave driver pull-up Ron within 1 LSB of the pull-down Ron.
申请公布号 US2004083070(A1) 申请公布日期 2004.04.29
申请号 US20020282798 申请日期 2002.10.29
申请人 INTEL CORPORATION 发明人 SALMON JOSEPH H.;TO HING Y.
分类号 G01R31/317;G01R35/00;G11C29/02;(IPC1-7):G01R35/00 主分类号 G01R31/317
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