| 摘要 |
<p>A communication hole (215) of a housing (20), that communicates with a contact (30), has specific diameter to allow a probe for performing conduction test of the connector (10), to be inserted into the hole. The contact in the housing, has exposed ends that are connected to a lead wire and a memory card when the card is inserted into the housing. The diameter of the hole is less than the width of the contact. Independent claims are also included for the following: (1) connector production method; (2) connector production efficiency improving method; and (3) connector conduction testing method.</p> |
