发明名称 |
WAFER WET ETCHING APPARATUS HAVING OVER-ETCHING PREVENTION FUNCTION |
摘要 |
PURPOSE: A wafer wet etching apparatus having an over-etching prevention function is provided to be capable of improving the yield of wafers. CONSTITUTION: A wafer wet etching apparatus includes an equipment control part(404), a chemical bath(301), and a drain pump(308). The chemical bath includes an outer bath(302) having a chemical drain valve(305) for exhausting chemical and an inner bath. At this time, the inner bath includes a chemical source valve(306) for supplying the chemical and a quick drain valve(307) connected with the drain pump for quickly exhausting the chemical. When related equipment malfunctions, an electric signal is transmitted from the equipment control part to the drain pump for operating the drain pump, so that the chemical of the chemical bath is exhausted.
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申请公布号 |
KR20040034128(A) |
申请公布日期 |
2004.04.28 |
申请号 |
KR20020064206 |
申请日期 |
2002.10.21 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, DEOK YEOL;LEE, GI JUN |
分类号 |
H01L21/3063;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/3063 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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