发明名称 |
OPTICAL MEMBER FOR OPTICAL LITHOGRAPHY AND EVALUATION METHOD THEREFOR |
摘要 |
<p>Amethod of evaluating a refractive index homogeneity of an optical member for photolithography, the method comprising:
a measurement step of transmitting light having a predetermined wavelength λ through the optical member so as to measure a wavefront aberration;a Zernike fitting step of expanding thus measured wavefront aberration into a polynomial of a Zernike cylindrical function system;a first separating step of separating individual components of the polynomial into a rotationally symmetric element, an odd-symmetric element, and an even-symmetric element; anda second separating step of separating individual components of the polynomial into a plurality of parts according to a degree thereof.</p> |
申请公布号 |
EP1413870(A1) |
申请公布日期 |
2004.04.28 |
申请号 |
EP20020743844 |
申请日期 |
2002.07.05 |
申请人 |
NIKON CORPORATION |
发明人 |
ENDO, KAZUMASA;HIRAIWA, HIROYUKI;NAKAGAWA, KAZUHIRO;MOCHIDA, MASAAKI |
分类号 |
G03F7/20;(IPC1-7):G01M11/00 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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