发明名称 OPTICAL MEMBER FOR OPTICAL LITHOGRAPHY AND EVALUATION METHOD THEREFOR
摘要 <p>Amethod of evaluating a refractive index homogeneity of an optical member for photolithography, the method comprising: a measurement step of transmitting light having a predetermined wavelength λ through the optical member so as to measure a wavefront aberration;a Zernike fitting step of expanding thus measured wavefront aberration into a polynomial of a Zernike cylindrical function system;a first separating step of separating individual components of the polynomial into a rotationally symmetric element, an odd-symmetric element, and an even-symmetric element; anda second separating step of separating individual components of the polynomial into a plurality of parts according to a degree thereof.</p>
申请公布号 EP1413870(A1) 申请公布日期 2004.04.28
申请号 EP20020743844 申请日期 2002.07.05
申请人 NIKON CORPORATION 发明人 ENDO, KAZUMASA;HIRAIWA, HIROYUKI;NAKAGAWA, KAZUHIRO;MOCHIDA, MASAAKI
分类号 G03F7/20;(IPC1-7):G01M11/00 主分类号 G03F7/20
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