发明名称 Apparatus and methods for enhancing thermal performance of integrated circuit packages
摘要 Novel methods and apparatus to enhance thermal performance of IC packages are disclosed. In an embodiment, a method of enhancing thermal uniformity across a semiconductor device is disclosed. The method includes providing the semiconductor device. The semiconductor device has a plurality of thermal regions. A first thermal region of the plurality of thermal regions has a different temperature than a second thermal region of the plurality of thermal regions. The method further provides a thermal enhancement material substantially adjacent to the first and second thermal regions. In another embodiment, a thermal conductivity of the thermal enhancement material is adjusted in relation to a temperature effecting the thermal enhancement material.
申请公布号 US6727193(B2) 申请公布日期 2004.04.27
申请号 US20020093669 申请日期 2002.03.08
申请人 SUN MICROSYSTEMS, INC. 发明人 GEKTIN VADIM;MALLADI DEVIPRASAD
分类号 H01L23/373;H01L23/433;H01L29/51;(IPC1-7):H01L21/26 主分类号 H01L23/373
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