发明名称 Surface inspection instrument and surface inspection method
摘要 Apparatus for inspecting a surface of an object to be measured. The light source applies light to the surface. An objective lens opposite the surface receives reflected light. A light detector detects a component of the light incident on the lens from a direction parallel to its optical axis and obtains its light quantity. A slit is provided in the optical path between the objective lens and the detector in order to narrow the light detection extent in the surface to be measured. The surface condition of the object can be measured with a good accuracy independently of the shape of the object.
申请公布号 US6727993(B2) 申请公布日期 2004.04.27
申请号 US19990147520 申请日期 1999.02.22
申请人 IDEMITSU PETROCHEMICAL CO., LTD. 发明人 TOMOMATSU RYUZOU
分类号 G01B11/24;G01N21/88;G01N21/93;(IPC1-7):G01N11/30 主分类号 G01B11/24
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