发明名称 Electrically programmed MOS transistor source/drain series resistance
摘要 High-speed MOS transistors are provided by forming a conductive layer embedded in transistor gate sidewall spacers. The embedded conductive layer is electrically insulated from the gate electrode and the source/drain regions of the transistor. The embedded conductive layer is positioned over the source/drain extensions and causes charge to accumulate in the source/drain extensions lowering the series resistance of the source/drain regions.
申请公布号 US6727534(B1) 申请公布日期 2004.04.27
申请号 US20010022847 申请日期 2001.12.20
申请人 ADVANCED MICRO DEVICES, INC. 发明人 BULLER JAMES F.;XIANG QI;WRISTERS DERICK J.
分类号 H01L21/8238;H01L21/336;H01L27/092;H01L29/423;H01L29/49;H01L29/78;(IPC1-7):H01L29/79;H01L29/94;H01L31/062;H01L31/113;H01L31/119 主分类号 H01L21/8238
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