发明名称 Closed loop monitoring of electroplating bath constituents using mass spectrometry
摘要 The present invention provides methods and apparatus for analysis and monitoring of electrolyte bath composition. Based on the results of the analysis, the invention controls electrolyte bath composition and plating hardware. Thus, the invention provides control of electroplating processes based on plating bath composition data. The invention accomplishes this by incorporating mass spectral analysis into a feedback control mechanism for electroplating. Mass spectrometry is used to identify plating bath conditions and based on the results, the plating bath formulation and plating process are controlled.
申请公布号 US6726824(B1) 申请公布日期 2004.04.27
申请号 US20010833385 申请日期 2001.04.11
申请人 NOVELLUS SYSTEMS, INC. 发明人 KHOSLA MUKUL
分类号 C25D21/12;(IPC1-7):C25D21/12;C25D5/00 主分类号 C25D21/12
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