发明名称 PROCESS CONTROL AT AN INTERCONNECT LEVEL
摘要 <p>A method and an apparatus for performing process control at an interconnect level. A process step upon a workpiece is performed. Manufacturing data relating to an interconnect location on the workpiece is acquired. An interconnect characteristic control process is performed based upon the manufacturing data. The interconnect characteristic control process includes controlling a process relating to a structure associated with the interconnect location on the workpiece to control a characteristic relating to the interconnect location.</p>
申请公布号 AU2003270745(A1) 申请公布日期 2004.04.23
申请号 AU20030270745 申请日期 2003.09.19
申请人 ADVANCED MICRO DEVICES, INC. 发明人 ROBERT, J. CHONG;ERIC, O. GREEN
分类号 G05B19/418;H01L21/66;(IPC1-7):H01L21/66 主分类号 G05B19/418
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