APPARATUS AND METHOD FOR MEASURING RADIATION ANGLE OF SEMICONDUCTOR LASER

摘要

PROBLEM TO BE SOLVED: To provide a system for measuring radiation angle of semiconductor laser which enables high-speed measurement without any operating portion, ensures higher resolution and easy calibration of the center of optical axis without use of lens. SOLUTION: The apparatus for measuring radiation angle of semiconductor laser has the structure which satisfies the relationships of 450×S≤D≤0.5×L and L≥900×S when the length in the longitudinal direction of the light receiving portion of a linear sensor 102 is L, size of the minimum pixel 103 of the light receiving portion of the linear sensor 102 is S, and the vertical direction between the light emitting point of the semiconductor laser device 101 and the light receiving portion of the linear sensor 102 is D. COPYRIGHT: (C)2004,JPO