发明名称 Hafnium nitride buffer layers for growth of GaN on silicon
摘要 Gallium nitride is grown by plasma-assisted molecular-beam epitaxy on (111) and (001) silicon substrates using hafnium nitride buffer layers. Wurtzite GaN epitaxial layers are obtained on both the (111) and (001) HfN/Si surfaces, with crack-free thickness up to 1.2 <custom-character file="US20040077165A1-20040422-P00900.TIF" wi="20" he="20" id="custom-character-00001"/>m. However, growth on the (001) surface results in nearly stress-free films, suggesting that much thicker crack-free layers could be obtained.
申请公布号 US2004077165(A1) 申请公布日期 2004.04.22
申请号 US20030439952 申请日期 2003.05.16
申请人 ARMITAGE ROBERT D.;WEBER EICKE R. 发明人 ARMITAGE ROBERT D.;WEBER EICKE R.
分类号 C30B23/02;H01L21/20;(IPC1-7):H01L21/302;H01L21/461 主分类号 C30B23/02
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