发明名称 |
Kontaktstruktur und Verfahren zu dessen Herstellung und eine Prüfkontaktanordnung, die diese verwendet |
摘要 |
A contact structure for establishing electrical connection with contact targets. The contact structure is formed of a contact substrate and a plurality of contactors. The contactor has an intermediate portion which is inserted in the through hole provided on the contact substrate in a vertical direction, a contact portion which is connected to the intermediate portion and positioned at one end of the contactor to function as a contact point for electrical connection with a contact target, and a base portion which is provided at other end of the contactor, and a spring portion having a cantilever shape upwardly inclined relative to the surface of the contact substrate and provided between the base portion and the intermediate portion. |
申请公布号 |
DE10196368(T5) |
申请公布日期 |
2004.04.22 |
申请号 |
DE2001196368T |
申请日期 |
2001.12.08 |
申请人 |
ADVANTEST CORP., TOKIO/TOKYO;ADVANTEST AMERICA R & D CENTER, INC. |
发明人 |
ZHOU, YU;YU, DAVID;ALDAZ, ROBERT EDWARD;KHOURY, THEODORE A. |
分类号 |
G01R1/067;G01R1/073;G01R3/00;G01R31/28;H01L21/302;H01L21/66;H01L23/48;H01L23/485;H01R12/00;H01R13/24;H05K1/00;H05K3/20;H05K3/40 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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