发明名称 Kontaktstruktur und Verfahren zu dessen Herstellung und eine Prüfkontaktanordnung, die diese verwendet
摘要 A contact structure for establishing electrical connection with contact targets. The contact structure is formed of a contact substrate and a plurality of contactors. The contactor has an intermediate portion which is inserted in the through hole provided on the contact substrate in a vertical direction, a contact portion which is connected to the intermediate portion and positioned at one end of the contactor to function as a contact point for electrical connection with a contact target, and a base portion which is provided at other end of the contactor, and a spring portion having a cantilever shape upwardly inclined relative to the surface of the contact substrate and provided between the base portion and the intermediate portion.
申请公布号 DE10196368(T5) 申请公布日期 2004.04.22
申请号 DE2001196368T 申请日期 2001.12.08
申请人 ADVANTEST CORP., TOKIO/TOKYO;ADVANTEST AMERICA R & D CENTER, INC. 发明人 ZHOU, YU;YU, DAVID;ALDAZ, ROBERT EDWARD;KHOURY, THEODORE A.
分类号 G01R1/067;G01R1/073;G01R3/00;G01R31/28;H01L21/302;H01L21/66;H01L23/48;H01L23/485;H01R12/00;H01R13/24;H05K1/00;H05K3/20;H05K3/40 主分类号 G01R1/067
代理机构 代理人
主权项
地址