发明名称 Material defect evaluation apparatus using positron and its evaluation method
摘要 A material defect evaluation apparatus using positron for evaluating the degree of deterioration of a specimen by measuring a positron lifetime after irradiating positron to the specimen, includes: a positron source, a positron detector and a gamma-ray detector, wherein, the positron source and the positron detector are arranged in a container through which a light is not transmitted, and, a positron transmitting window, through which position emanating from the positron source and transmitting through the positron detector is transmitted outward, is arranged to the container.
申请公布号 US2004075052(A1) 申请公布日期 2004.04.22
申请号 US20030606485 申请日期 2003.06.26
申请人 OSAKA UNIVERSITY 发明人 SHIRAI YASUHARU;ARAKI HIDEKI
分类号 G01Q30/08;G01N23/22;G01T1/16;G01T1/24;(IPC1-7):G01N23/22 主分类号 G01Q30/08
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