发明名称 METHOD FOR WASHING SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a method for washing a substrate by which the substrate can sufficiently being washed while suppressing increase of roughness by only one washing time. SOLUTION: This method comprises steps of: treating the substrate with ozone water with a concentration of 15 ppm or higher (steps S21-S30), and treating the substrate with dilute hydrofluoric acid with a concentration of 0.1-10% (steps S21-S30). Contaminant on the film surface is eliminated and an oxidized film is formed as a protective film by ozone water. By using hydrofluoric acid, the oxidized film and metals on the surface of the substrate are eliminated. By using ozone water again, organic substance elimination, metal elimination and passivation (protective film forming and prevention of re-adhesion of contaminant) are performed. Only one time of washing by using ozone water with adequate concentration surely eliminates contaminant to suppress the increase of roughness. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004121906(A) 申请公布日期 2004.04.22
申请号 JP20020286128 申请日期 2002.09.30
申请人 SEIKO EPSON CORP 发明人 MORI YUKIO;MIURA EIICHI
分类号 G02F1/1333;B08B3/08;B08B3/10;C11D7/02;C11D7/08;C11D17/00;(IPC1-7):B08B3/08;G02F1/133 主分类号 G02F1/1333
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