发明名称 Method for fabricating laminated silicon gate electrode
摘要 Within a method for forming a silicon layer, there is employed at least one sub-layer formed of a higher crystalline silicon material and at least one sub-layer formed of a lower crystalline silicon material. The lower crystalline silicon material is formed employing a hydrogen treatment of the higher crystalline silicon material. The method is particularly useful for forming polysilicon based gate electrodes with enhanced dimensional control and enhanced performance.
申请公布号 US2004077155(A1) 申请公布日期 2004.04.22
申请号 US20020274570 申请日期 2002.10.21
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 CHEN CHIA-LIN;YAO LIANG-GI;CHEN SHIH-CHANG
分类号 H01L21/20;H01L21/28;H01L21/30;H01L29/49;H01L29/78;(IPC1-7):H01L21/20;H01L21/36 主分类号 H01L21/20
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