发明名称 |
SYSTEM ZUR KONTAKTLOSEN PRÜFUNG VON INTEGRIERTEN SCHALTUNGEN |
摘要 |
A system for testing a microelectronic circuit includes a test bed for mounting a microelectronic circuit, and a signal source for applying a signal to a microelectronic circuit mounted on the test bed. The system additionally includes a test probe for wirelessly receiving electromagnetic response signals from the microelectronic circuit mounted on the test bed. In a preferred form, the electromagnetic response signals are radio-frequency signals. The test system additionally includes a computer connected to the test probe for analyzing the electromagnetic response signals. An integrated circuit for testing on the test system has a test circuit portion that emits electromagnetic radiation in response to a predetermined signal applied to the test circuit. |
申请公布号 |
DE69910084(T2) |
申请公布日期 |
2004.04.22 |
申请号 |
DE1999610084T |
申请日期 |
1999.05.21 |
申请人 |
CONEXANT SYSTEMS, INC. |
发明人 |
WHITE, A.;WALLEY, S.;JOHNSTON, W.;HENDERSON, MICHAEL;ANDREWS, B.;SIANN, I.;HALE, H. |
分类号 |
G01R31/302;G01R31/28;G01R31/311;H01L21/822;H01L27/04;(IPC1-7):G01R31/316 |
主分类号 |
G01R31/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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