ELECTRIC CIRCUIT AND METHOD OF INSPECTING INTEGRITY OF PHOTODIODE ARRAY

摘要

PROBLEM TO BE SOLVED: To provide a method of inspecting the integrity of a conductor joint connected to a microprocessor which is spatially separated from a photodiode array.

SOLUTION: A connection is made to a ground potential or a supply potential via an internal fixed resistance in the event of failure, at a high resistance in the event of failure where the output part of the photodiode does not operate. The output part of the photodiode array is connected to the ground potential or the supply potential via a first inspection resistance spatially arranged close to the array, and an input part of an analog/digital converter of the microprocessor provided for a signal input part is connected to a port output part of the microprocessor, which is selectively connectable to the ground potential or the supply potential via a second inspection resistance spatially arranged close to the input part.

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