Non-destructive analysis process and use to determine condition of a solar cell uses raman spectra and electrical measurement of semiconductor layer before finishing cell

摘要

A non-destructive analysis process to determine the condition of a solar cell comprises using Raman data to find the structural properties of the semiconductor layer and a current/voltage measure. FWHM data is obtained directly after the production of the absorbing layer and used to predict the electrical properties of the finished cell.