| 摘要 |
PROBLEM TO BE SOLVED: To make connection of a contact probe to a semiconductor, an electronic part and an electric device for measuring an electric signal easy and improve reliability, stability and durability in response to data transmission of large capacity and high speed. SOLUTION: In this contact probe, a helical R flute 2 of which sliding edge of section area is in a round form is formed at a helical flute of a plunger 1 and a plane calking 5 and a spring 8 are provided at a sleeve 7. COPYRIGHT: (C)2004,JPO
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